A statistical study of the effectiveness of BIST jitter measurement techniques

David Bordoley, Hieu Nguyen, Mani Soma. A statistical study of the effectiveness of BIST jitter measurement techniques. In 2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA. pages 100-107, IEEE Computer Society, 2005.

Abstract

Abstract is missing.