Introspection Into Reliability Aspects in AlGaN/GaN HEMTs With Gate Geometry Modification

Sushanta Bordoloi, Ashok Ray, Gaurav Trivedi. Introspection Into Reliability Aspects in AlGaN/GaN HEMTs With Gate Geometry Modification. IEEE Access, 9:99828-99841, 2021. [doi]

Authors

Sushanta Bordoloi

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Ashok Ray

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Gaurav Trivedi

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