Sushanta Bordoloi, Ashok Ray, Gaurav Trivedi. Introspection Into Reliability Aspects in AlGaN/GaN HEMTs With Gate Geometry Modification. IEEE Access, 9:99828-99841, 2021. [doi]
@article{BordoloiRT21, title = {Introspection Into Reliability Aspects in AlGaN/GaN HEMTs With Gate Geometry Modification}, author = {Sushanta Bordoloi and Ashok Ray and Gaurav Trivedi}, year = {2021}, doi = {10.1109/ACCESS.2021.3096988}, url = {https://doi.org/10.1109/ACCESS.2021.3096988}, researchr = {https://researchr.org/publication/BordoloiRT21}, cites = {0}, citedby = {0}, journal = {IEEE Access}, volume = {9}, pages = {99828-99841}, }