Logic Architecture and VDD Selection for Reducing the Impact of Intra-die Random V::T:: Variations on Timing

Bahman Kheradmand Boroujeni, Christian Piguet, Yusuf Leblebici. Logic Architecture and VDD Selection for Reducing the Impact of Intra-die Random V::T:: Variations on Timing. In René van Leuken, Gilles Sicard, editors, Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation - 20th International Workshop, PATMOS 2010, Grenoble, France, September 7-10, 2010, Revised Selected Papers. Volume 6448 of Lecture Notes in Computer Science, pages 170-179, Springer, 2010. [doi]

Abstract

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