Jonathan Borremans, Ludwig De Locht, Piet Wambacq, Yves Rolain. Nonlinearity analysis of Analog/RF circuits using combined multisine and volterra analysis. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 261-266, ACM, 2007. [doi]
Abstract is missing.