Soumitra Bose, Vishwani D. Agrawal. Fault Coverage Estimation for Non-Random Functional Input Sequences. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
@inproceedings{BoseA06-0, title = {Fault Coverage Estimation for Non-Random Functional Input Sequences}, author = {Soumitra Bose and Vishwani D. Agrawal}, year = {2006}, doi = {10.1109/TEST.2006.297648}, url = {http://dx.doi.org/10.1109/TEST.2006.297648}, researchr = {https://researchr.org/publication/BoseA06-0}, cites = {0}, citedby = {0}, pages = {1-10}, booktitle = {2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006}, editor = {Scott Davidson and Anne Gattiker}, publisher = {IEEE}, isbn = {1-4244-0292-1}, }