Investigations on double-diffused MOS transistors under ESD zap conditions - researchr publication authors

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Gianluca Boselli, Stan Meeuwsen, Ton J. Mouthaan, Fred G. Kuper. Investigations on double-diffused MOS transistors under ESD zap conditions. Microelectronics Reliability, 41(3):395-405, 2001. [doi]

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