Reliability assessment of FreeRTOS in Embedded Systems - researchr publication authors

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Alberto Bosio, Maurizio Rebaudengo, Alessandro Savino. Reliability assessment of FreeRTOS in Embedded Systems. In 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022, Supplemental Volume, Baltimore, MD, USA, June 27-30, 2022. pages 28-30, IEEE, 2022. [doi]

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