Alberto Bosio, Maurizio Rebaudengo, Alessandro Savino. Reliability assessment of FreeRTOS in Embedded Systems. In 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022, Supplemental Volume, Baltimore, MD, USA, June 27-30, 2022. pages 28-30, IEEE, 2022. [doi]
@inproceedings{BosioRS22,
title = {Reliability assessment of FreeRTOS in Embedded Systems},
author = {Alberto Bosio and Maurizio Rebaudengo and Alessandro Savino},
year = {2022},
doi = {10.1109/DSN-S54099.2022.00019},
url = {https://doi.org/10.1109/DSN-S54099.2022.00019},
researchr = {https://researchr.org/publication/BosioRS22},
cites = {0},
citedby = {0},
pages = {28-30},
booktitle = {52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022, Supplemental Volume, Baltimore, MD, USA, June 27-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-0260-6},
}