Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage

Douglas C. Bossen, M. Y. (Ben) Hsiao. Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage. IBM Journal of Research and Development, 26(1):67-77, 1982.

Authors

Douglas C. Bossen

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M. Y. (Ben) Hsiao

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