Douglas C. Bossen, M. Y. (Ben) Hsiao. Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage. IBM Journal of Research and Development, 26(1):67-77, 1982.
@article{BossenH82,
title = {Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage},
author = {Douglas C. Bossen and M. Y. (Ben) Hsiao},
year = {1982},
tags = {C++, coverage},
researchr = {https://researchr.org/publication/BossenH82},
cites = {0},
citedby = {0},
journal = {IBM Journal of Research and Development},
volume = {26},
number = {1},
pages = {67-77},
}