Bill Bottoms, Jim Chung, Bernd Koenemann, Glenn Shirley, Lisa Spainhower. Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 153-154, IEEE Computer Society, 2001. [doi]
@inproceedings{BottomsCKSS01,
title = {Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue},
author = {Bill Bottoms and Jim Chung and Bernd Koenemann and Glenn Shirley and Lisa Spainhower},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/vts/2001/1122/00/11220153abs.htm},
tags = {testing, product line},
researchr = {https://researchr.org/publication/BottomsCKSS01},
cites = {0},
citedby = {0},
pages = {153-154},
booktitle = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1122-8},
}