Bill Bottoms, Jim Chung, Bernd Koenemann, Glenn Shirley, Lisa Spainhower. Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 153-154, IEEE Computer Society, 2001. [doi]
Abstract is missing.