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Ageing of SiC JFET transistors under repetitive current limitation conditions

M. Bouarroudj-Berkani, D. Othman, Stéphane Lefebvre, S. Moumen, Zoubir Khatir, T. Ben Sallah. Ageing of SiC JFET transistors under repetitive current limitation conditions. Microelectronics Reliability, 50(9-11):1532-1537, 2010. [doi]

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M. Bouarroudj-Berkani

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D. Othman

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Stéphane Lefebvre

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S. Moumen

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Zoubir Khatir

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T. Ben Sallah

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