M. Bouarroudj-Berkani, D. Othman, Stéphane Lefebvre, S. Moumen, Zoubir Khatir, T. Ben Sallah. Ageing of SiC JFET transistors under repetitive current limitation conditions. Microelectronics Reliability, 50(9-11):1532-1537, 2010. [doi]
@article{Bouarroudj-BerkaniOLMKS10,
title = {Ageing of SiC JFET transistors under repetitive current limitation conditions},
author = {M. Bouarroudj-Berkani and D. Othman and Stéphane Lefebvre and S. Moumen and Zoubir Khatir and T. Ben Sallah},
year = {2010},
doi = {10.1016/j.microrel.2010.07.035},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.035},
researchr = {https://researchr.org/publication/Bouarroudj-BerkaniOLMKS10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1532-1537},
}