Ageing of SiC JFET transistors under repetitive current limitation conditions

M. Bouarroudj-Berkani, D. Othman, Stéphane Lefebvre, S. Moumen, Zoubir Khatir, T. Ben Sallah. Ageing of SiC JFET transistors under repetitive current limitation conditions. Microelectronics Reliability, 50(9-11):1532-1537, 2010. [doi]

Abstract

Abstract is missing.