A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters - researchr publication

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Ahcène Bounceur, Samia Djemai, Belkacem Brahmi, Mohand Ouamer Bibi, Reinhardt Euler. A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters. J. Electronic Testing, 34(3):321-335, 2018. [doi]

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