Algorithms for Detection of Faults in Logic Circuits

Willard G. Bouricius, Edward P. Hsieh, Gianfranco R. Putzolu, J. Paul Roth, Peter R. Schneider, Chung-Jen Tan. Algorithms for Detection of Faults in Logic Circuits. IEEE Transactions on Computers, 20(11):1258-1264, 1971. [doi]

Abstract

Abstract is missing.