M. Boutillier, O. Gauthier-Lafaye, S. Bonnefont, F. Lozes-Dupuy, F.-J. Vermersch, M. Krakowski, O. Gilard. Strong electron irradiation hardness of 852 nm Al-free laser diodes. Microelectronics Reliability, 46(9-11):1715-1719, 2006. [doi]
Abstract is missing.