Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques

M. Bouya, N. Malbert, Nathalie Labat, D. Carisetti, Philippe Perdu, J. C. Clement, B. Lambert, M. Bonnet. Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques. Microelectronics Reliability, 48(8-9):1366-1369, 2008. [doi]

Abstract

Abstract is missing.