Keith A. Bowman, Carlos Tokunaga, James W. Tschanz, Tanay Karnik, Vivek K. De. Adaptive and Resilient Circuits for Dynamic Variation Tolerance. IEEE Design & Test of Computers, 30(6):8-17, 2013. [doi]
@article{BowmanTTKD13,
title = {Adaptive and Resilient Circuits for Dynamic Variation Tolerance},
author = {Keith A. Bowman and Carlos Tokunaga and James W. Tschanz and Tanay Karnik and Vivek K. De},
year = {2013},
doi = {10.1109/MDAT.2013.2267958},
url = {http://doi.ieeecomputersociety.org/10.1109/MDAT.2013.2267958},
researchr = {https://researchr.org/publication/BowmanTTKD13},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {30},
number = {6},
pages = {8-17},
}