Keith A. Bowman, Carlos Tokunaga, James W. Tschanz, Arijit Raychowdhury, Muhammad M. Khellah, Bibiche M. Geuskens, Shih-Lien Lu, Paolo A. Aseron, Tanay Karnik, Vivek K. De. All-Digital Circuit-Level Dynamic Variation Monitor for Silicon Debug and Adaptive Clock Control. IEEE Trans. on Circuits and Systems, 58-I(9):2017-2025, 2011. [doi]
Abstract is missing.