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Resilient Subclass Discriminant Analysis with Application to Prelens Tear Film Interferometry

Kim L. Boyer, Dijia Wu. Resilient Subclass Discriminant Analysis with Application to Prelens Tear Film Interferometry. In José Francisco Martínez Trinidad, Jesús Ariel Carrasco-Ochoa, Cherif Ben-Youssef Brants, Edwin Robert Hancock, editors, Pattern Recognition - Third Mexican Conference, MCPR 2011, Cancun, Mexico, June 29 - July 2, 2011. Proceedings. Volume 6718 of Lecture Notes in Computer Science, pages 1-11, Springer, 2011. [doi]

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Kim L. Boyer

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Dijia Wu

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