Kim L. Boyer, Dijia Wu. Resilient Subclass Discriminant Analysis with Application to Prelens Tear Film Interferometry. In José Francisco Martínez Trinidad, Jesús Ariel Carrasco-Ochoa, Cherif Ben-Youssef Brants, Edwin Robert Hancock, editors, Pattern Recognition - Third Mexican Conference, MCPR 2011, Cancun, Mexico, June 29 - July 2, 2011. Proceedings. Volume 6718 of Lecture Notes in Computer Science, pages 1-11, Springer, 2011. [doi]
@inproceedings{BoyerW11,
title = {Resilient Subclass Discriminant Analysis with Application to Prelens Tear Film Interferometry},
author = {Kim L. Boyer and Dijia Wu},
year = {2011},
doi = {10.1007/978-3-642-21587-2_1},
url = {http://dx.doi.org/10.1007/978-3-642-21587-2_1},
tags = {analysis},
researchr = {https://researchr.org/publication/BoyerW11},
cites = {0},
citedby = {0},
pages = {1-11},
booktitle = {Pattern Recognition - Third Mexican Conference, MCPR 2011, Cancun, Mexico, June 29 - July 2, 2011. Proceedings},
editor = {José Francisco Martínez Trinidad and Jesús Ariel Carrasco-Ochoa and Cherif Ben-Youssef Brants and Edwin Robert Hancock},
volume = {6718},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-21586-5},
}