Kim L. Boyer, Dijia Wu. Resilient Subclass Discriminant Analysis with Application to Prelens Tear Film Interferometry. In José Francisco Martínez Trinidad, Jesús Ariel Carrasco-Ochoa, Cherif Ben-Youssef Brants, Edwin Robert Hancock, editors, Pattern Recognition - Third Mexican Conference, MCPR 2011, Cancun, Mexico, June 29 - July 2, 2011. Proceedings. Volume 6718 of Lecture Notes in Computer Science, pages 1-11, Springer, 2011. [doi]
No reviews for this publication, yet.