Lower Overhead Design for Testability of Programmable Logic Arrays

Saied Bozorgui-Nesbat, Edward J. McCluskey. Lower Overhead Design for Testability of Programmable Logic Arrays. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 856-865, IEEE Computer Society, 1984.

@inproceedings{Bozorgui-NesbatM84,
  title = {Lower Overhead Design for Testability of Programmable Logic Arrays},
  author = {Saied Bozorgui-Nesbat and Edward J. McCluskey},
  year = {1984},
  tags = {testing, logic programming, logic, design},
  researchr = {https://researchr.org/publication/Bozorgui-NesbatM84},
  cites = {0},
  citedby = {0},
  pages = {856-865},
  booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984},
  publisher = {IEEE Computer Society},
}