L. Brackmann, A. Jafari, C. Bengel, M. Mayahinia, R. Waser, D. Wouters, S. Menzel, M. Tahoori. A failure analysis framework of ReRAM In-Memory Logic operations. In IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022. pages 67-72, IEEE, 2022. [doi]
@inproceedings{BrackmannJBMWWM22,
title = {A failure analysis framework of ReRAM In-Memory Logic operations},
author = {L. Brackmann and A. Jafari and C. Bengel and M. Mayahinia and R. Waser and D. Wouters and S. Menzel and M. Tahoori},
year = {2022},
doi = {10.1109/ITCAsia55616.2022.00022},
url = {https://doi.org/10.1109/ITCAsia55616.2022.00022},
researchr = {https://researchr.org/publication/BrackmannJBMWWM22},
cites = {0},
citedby = {0},
pages = {67-72},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022},
publisher = {IEEE},
isbn = {978-1-6654-5523-7},
}