L. Brackmann, A. Jafari, C. Bengel, M. Mayahinia, R. Waser, D. Wouters, S. Menzel, M. Tahoori. A failure analysis framework of ReRAM In-Memory Logic operations. In IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022. pages 67-72, IEEE, 2022. [doi]
Abstract is missing.