Active surface modeling at CT resolution limits with micro CT ground truth

Andrew P. Bradshaw, Michael J. Todd, David S. Taubman. Active surface modeling at CT resolution limits with micro CT ground truth. In Proceedings of the International Conference on Image Processing, ICIP 2008, October 12-15, 2008, San Diego, California, USA. pages 1081-1084, IEEE, 2008. [doi]

Abstract

Abstract is missing.