Layout techniques for radiation hardening of standard CMOS active pixel sensors

Leo Huf Campos Braga, Suzana Domingues, Milton F. Rocha, Leonardo Bruno de Sá, Fernando de Souza Campos, Filipe V. Santos, Antonio Carneiro Mesquita, Mário Vaz Silva, Jacobus W. Swart. Layout techniques for radiation hardening of standard CMOS active pixel sensors. In Antonio Petraglia, Volnei A. Pedroni, Gert Cauwenberghs, editors, Proceedings of the 20th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2007, Copacabana, Rio de Janeiro, Brazil, September 3-6, 2007. pages 257-262, ACM, 2007. [doi]

@inproceedings{BragaDRSCSMSS07,
  title = {Layout techniques for radiation hardening of standard CMOS active pixel sensors},
  author = {Leo Huf Campos Braga and Suzana Domingues and Milton F. Rocha and Leonardo Bruno de Sá and Fernando de Souza Campos and Filipe V. Santos and Antonio Carneiro Mesquita and Mário Vaz Silva and Jacobus W. Swart},
  year = {2007},
  doi = {10.1145/1284480.1284550},
  url = {http://doi.acm.org/10.1145/1284480.1284550},
  tags = {layout},
  researchr = {https://researchr.org/publication/BragaDRSCSMSS07},
  cites = {0},
  citedby = {0},
  pages = {257-262},
  booktitle = {Proceedings of the 20th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2007, Copacabana, Rio de Janeiro, Brazil, September 3-6, 2007},
  editor = {Antonio Petraglia and Volnei A. Pedroni and Gert Cauwenberghs},
  publisher = {ACM},
  isbn = {978-1-59593-816-9},
}