Hardware Demonstration of Atomic Force Microscopy Imaging Via Compressive Sensing and μ-Path Scans - researchr publication authors

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Roger A. Braker, Yufan Luo, Lucy Y. Pao, Sean B. Andersson. Hardware Demonstration of Atomic Force Microscopy Imaging Via Compressive Sensing and μ-Path Scans. In 2018 Annual American Control Conference, ACC 2018, Milwaukee, WI, USA, June 27-29, 2018. pages 6037-6042, IEEE, 2018. [doi]

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