Roger A. Braker, Yufan Luo, Lucy Y. Pao, Sean B. Andersson. Hardware Demonstration of Atomic Force Microscopy Imaging Via Compressive Sensing and μ-Path Scans. In 2018 Annual American Control Conference, ACC 2018, Milwaukee, WI, USA, June 27-29, 2018. pages 6037-6042, IEEE, 2018. [doi]
@inproceedings{BrakerLPA18,
title = {Hardware Demonstration of Atomic Force Microscopy Imaging Via Compressive Sensing and μ-Path Scans},
author = {Roger A. Braker and Yufan Luo and Lucy Y. Pao and Sean B. Andersson},
year = {2018},
doi = {10.23919/ACC.2018.8431873},
url = {https://doi.org/10.23919/ACC.2018.8431873},
researchr = {https://researchr.org/publication/BrakerLPA18},
cites = {0},
citedby = {0},
pages = {6037-6042},
booktitle = {2018 Annual American Control Conference, ACC 2018, Milwaukee, WI, USA, June 27-29, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5428-6},
}