Giovanni Breglio, Andrea Irace, E. Napoli, Paolo Spirito, K. Hamada, T. Nishijima, T. Ueta. Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell. Microelectronics Reliability, 47(9-11):1756-1760, 2007. [doi]
@article{BreglioINSHNU07,
title = {Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell},
author = {Giovanni Breglio and Andrea Irace and E. Napoli and Paolo Spirito and K. Hamada and T. Nishijima and T. Ueta},
year = {2007},
doi = {10.1016/j.microrel.2007.07.009},
url = {http://dx.doi.org/10.1016/j.microrel.2007.07.009},
researchr = {https://researchr.org/publication/BreglioINSHNU07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {9-11},
pages = {1756-1760},
}