Leonardo H. Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis. Evaluation of SET under Process Variability on FinFET Multi-level Design. In 27th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, Cuzco, Peru, October 6-9, 2019. pages 179-184, IEEE, 2019. [doi]
Abstract is missing.