Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90 nm CMOS ASICs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Ciaran J. Brennan, Shunhua Chang, Min Woo, Kiran V. Chatty, Robert Gauthier. Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90 nm CMOS ASICs. Microelectronics Reliability, 47(7):1030-1035, 2007. [doi]

This author has not been identified. Look up 'Ciaran J. Brennan' in GoogleThis author has not been identified. Look up 'Shunhua Chang' in GoogleThis author has not been identified. Look up 'Min Woo' in GoogleThis author has not been identified. Look up 'Kiran V. Chatty' in GoogleThis author has not been identified. Look up 'Robert Gauthier' in Google

runs on WebDSL