Ciaran J. Brennan, Shunhua Chang, Min Woo, Kiran V. Chatty, Robert Gauthier. Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90 nm CMOS ASICs. Microelectronics Reliability, 47(7):1030-1035, 2007. [doi]
@article{BrennanCWCG07,
title = {Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90 nm CMOS ASICs},
author = {Ciaran J. Brennan and Shunhua Chang and Min Woo and Kiran V. Chatty and Robert Gauthier},
year = {2007},
doi = {10.1016/j.microrel.2006.11.009},
url = {http://dx.doi.org/10.1016/j.microrel.2006.11.009},
researchr = {https://researchr.org/publication/BrennanCWCG07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {7},
pages = {1030-1035},
}