Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90 nm CMOS ASICs - researchr publication

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Ciaran J. Brennan, Shunhua Chang, Min Woo, Kiran V. Chatty, Robert Gauthier. Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90 nm CMOS ASICs. Microelectronics Reliability, 47(7):1030-1035, 2007. [doi]

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