Determining error rate in error tolerant VLSI chips - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Melvin A. Breuer. Determining error rate in error tolerant VLSI chips. In 2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia. pages 321-326, IEEE Computer Society, 2004. [doi]

This author has not been identified. Look up 'Melvin A. Breuer' in Google

runs on WebDSL