Melvin A. Breuer. Determining error rate in error tolerant VLSI chips. In 2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia. pages 321-326, IEEE Computer Society, 2004. [doi]
@inproceedings{Breuer04:0, title = {Determining error rate in error tolerant VLSI chips}, author = {Melvin A. Breuer}, year = {2004}, url = {http://csdl.computer.org/comp/proceedings/delta/2004/2081/00/20810321abs.htm}, researchr = {https://researchr.org/publication/Breuer04%3A0}, cites = {0}, citedby = {0}, pages = {321-326}, booktitle = {2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia}, publisher = {IEEE Computer Society}, isbn = {0-7695-2081-2}, }