Process-Aggravated Noise (PAN): New Validation and Test Problems - researchr publication authors

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Melvin A. Breuer, Sandeep K. Gupta. Process-Aggravated Noise (PAN): New Validation and Test Problems. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 914-923, IEEE Computer Society, 1996.

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