Melvin A. Breuer, Sandeep K. Gupta. Process-Aggravated Noise (PAN): New Validation and Test Problems. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 914-923, IEEE Computer Society, 1996.
@inproceedings{BreuerG96,
title = {Process-Aggravated Noise (PAN): New Validation and Test Problems},
author = {Melvin A. Breuer and Sandeep K. Gupta},
year = {1996},
tags = {testing},
researchr = {https://researchr.org/publication/BreuerG96},
cites = {0},
citedby = {0},
pages = {914-923},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}