Giovani Britton, Salvador Mir, Estelle Lauga-Larroze, Benjamin Dormieu, Jose Lugo, Joao Azevedo, Sebastien Sadlo, Quentin Berlingard, Mikaël Cassé, Philippe Galy. Using DC Transistor Characterization Measurements for LNA Design at Cryogenic Temperatures. J. Electronic Testing, 42(2):259-271, April 2026. [doi]
Abstract is missing.