Stephane Bronckers, Charlotte Soens, Geert Van der Plas, Gerd Vandersteen, Yves Rolain. Interactive presentation: Simulation methodology and experimental verification for the analysis of substrate noise on LC-VCO s. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 1520-1525, ACM, 2007. [doi]
Abstract is missing.