Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen 0001. Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm. In 67th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2024, Springfield, MA, USA, August 11-14, 2024. pages 571-575, IEEE, 2024. [doi]
Abstract is missing.