Degang Chen 0001 - researchr alias

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Viewing Publication 1 - 20 from 20

2023

A Resistorless Precision Curvature-Compensated Bandgap Voltage Reference Based on the VGO Extraction TechniqueDaniel Adjei, Bryce Gadogbe, Degang Chen 0001, Randall L. Geiger. iscas 2023: 1-5 [doi]

A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site TestingIsaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001. et, 39(1):57-69, February 2023. [doi]

Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and CorrectionPraise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001. dt, 40(5):52-61, October 2023. [doi]

Sub-ppm/°C High Performance Voltage ReferenceBryce Gadogbe, Daniel Adjei, Kwabena Oppong Banahene, Randall L. Geiger, Degang Chen 0001. iscas 2023: 1-4 [doi]

Systematic Methodology to Design High Precision Voltage References with Sub-ppm/°C Temperature CoefficientVijayalakshmi Naganadhan, Marampally Saikiran, Mahmoud Gshash, Degang Chen 0001. ewdts 2023: 1-11 [doi]

Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-EfficiencyMarampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen 0001. ewdts 2023: 1-6 [doi]

Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An OverviewMarampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen 0001. ewdts 2023: 1-5 [doi]

A Power Supply Rejection Based Approach for Robust Defect Detection in Operational AmplifiersMichael Sekyere, Marampally Saikiran, Degang Chen 0001. ewdts 2023: 1-6 [doi]

2022

Hardware Security Vulnerability in Analog Signal Chain FiltersKwabena Oppong Banahene, Matthew R. Strong, Bryce Gadogbe, Degang Chen 0001, Randall L. Geiger. iscas 2022: 667-671 [doi]

Level Shifters for Charge Constrained ApplicationsKushagra Bhatheja, Matthew R. Strong, Degang Chen 0001. iscas 2022: 1203-1204 [doi]

Low Cost High Accuracy Stimulus Generator for On-chip Spectral TestingKushagra Bhatheja, Shravan K. Chaganti, Degang Chen 0001, Xiankun Robert Jin, Chris C. Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R. Knight, Allan Dobbin, Scott W. Herrin, Doug Garrity. itc 2022: 514-518 [doi]

Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite TestingPraise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001. itc 2022: 509-513 [doi]

Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel TestingPraise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001. dft 2022: 1-6 [doi]

A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site TestingPraise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001. et, 38(6):637-651, December 2022. [doi]

A Wide-Range Low-cost Temperature to Digital Converter Independent of Device ModelsMona Ganji, Marampally Saikiran, Degang Chen 0001. iscas 2022: 605-609 [doi]

A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) CircuitsMarampally Saikiran, Mona Ganji, Degang Chen 0001. sbcci 2022: 1-6 [doi]

Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage RegulatorsMarampally Saikiran, Mona Ganji, Degang Chen 0001. sbcci 2022: 1-6 [doi]

Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch InjectionMarampally Saikiran, Mona Ganji, Degang Chen 0001. iscas 2022: 1580-1584 [doi]

All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High CoverageMichael Sekyere, Marampally Saikiran, Degang Chen 0001. iolts 2022: 1-5 [doi]

2001

Causal inversion of nonminimum phase systemsXuezhen Wang, Degang Chen 0001. cdc 2001: 73-78 [doi]

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Publications by 'Degang Chen 0001'

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2001

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