Michael Sekyere, Marampally Saikiran, Degang Chen 0001. All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage. In Alessandro Savino, Paolo Rech, Stefano Di Carlo, Dimitris Gizopoulos, editors, 28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Torino, Italy, September 12-14, 2022. pages 1-5, IEEE, 2022. [doi]
Abstract is missing.