Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency

Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen 0001. Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency. In IEEE East-West Design & Test Symposium, EWDTS 2023, Batumi, Georgia, September 22-25, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

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