Marampally Saikiran, Mona Ganji, Degang Chen 0001. Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators. In 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, SBCCI 2022, Porto Alegre, Brazil, August 22-26, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.