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Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?

N. Buard, F. Miller, C. Ruby, R. Gaillard. Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 63-70, IEEE Computer Society, 2007. [doi]

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N. Buard

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F. Miller

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C. Ruby

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R. Gaillard

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