N. Buard, F. Miller, C. Ruby, R. Gaillard. Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 63-70, IEEE Computer Society, 2007. [doi]
@inproceedings{BuardMRG07,
title = {Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?},
author = {N. Buard and F. Miller and C. Ruby and R. Gaillard},
year = {2007},
doi = {10.1109/IOLTS.2007.42},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.42},
tags = {injection attack, C++, Ruby},
researchr = {https://researchr.org/publication/BuardMRG07},
cites = {0},
citedby = {0},
pages = {63-70},
booktitle = {13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece},
publisher = {IEEE Computer Society},
}